A 252Cf fission fragment-induced desorption mass spectrometer: Design, operation and performance

作者: Harald Danigel , Hartmut Jungclas , Lothar Schmidt

DOI: 10.1016/0020-7381(83)85044-X

关键词: Selected reaction monitoringSecondary ion mass spectrometryFissionIonAnalytical chemistryMass spectrometryChemistryIonizationIon sourceHybrid mass spectrometer

摘要: This time-of-flight mass spectrometer utilizes the 252Cf fission fragment-induced ionization of organic solids and electrostatic desorption. It is designed for high sensitivity needed in quantitative analysis pharmaceuticals can be combined with a high-performance liquid chromatograph. The solute emerges into rough vacuum stage sampling up to twelve fractions vacuum-drying process. Samples low vapor pressure are introduced periodically ion source by means an interfacing disk analysed successively. detection employing conversion electrons microchannel plates investigated. performance discussed terms resolution, efficiency reproducibility.

参考文章(18)
R.D. Macfarlane, D.F. Torgerson, 252Cf-plasma desorption time-of-flight mass spectrometry International Journal of Mass Spectrometry and Ion Physics. ,vol. 21, pp. 81- 92 ,(1976) , 10.1016/0020-7381(76)80068-X
Yuriko Kawama, Michi Aratani, “In situ” mass spectrometry of alpha particle tracks through mica bombarded with a backing 241-americium source International Journal of Mass Spectrometry and Ion Physics. ,vol. 10, pp. 493- 495 ,(1973) , 10.1016/0020-7381(73)83028-1
B.T. Chait, F.H. Field, Fission fragment ionization mass spectrometry: Metastable decompositions International Journal of Mass Spectrometry and Ion Physics. ,vol. 41, pp. 17- 29 ,(1981) , 10.1016/0020-7381(81)85014-0
R.J. Beuhler, L. Friedman, Threshold studies of secondary electron emission induced by macro-ion impact on solid surfaces Nuclear Instruments and Methods. ,vol. 170, pp. 309- 315 ,(1980) , 10.1016/0029-554X(80)91031-9
R.J. Beuhler, L. Friedman, Low noise, high voltage secondary emission ion detector for polyatomic ions International Journal of Mass Spectrometry and Ion Physics. ,vol. 23, pp. 81- 97 ,(1977) , 10.1016/0020-7381(77)80091-0
Harald Danigel, R.D. Macfarlane, Beam profile analysis for a 252Cf plasma-desorption time-of-flight mass spectrometer International Journal of Mass Spectrometry and Ion Physics. ,vol. 39, pp. 157- 166 ,(1981) , 10.1016/0020-7381(81)80030-7
Hartmut Jungclas, Harald Danigel, Lothar Schmidt, Fractional sampling interface for combined liquid chromatography–mass spectrometry with 252CF fission fragment-induced ionization Journal of Chromatography A. ,vol. 271, pp. 35- 41 ,(1983) , 10.1016/S0021-9673(00)80196-X
O. Becker, N. Fürstenau, F.R. Krueger, G. Weiβ, K. Wien, Ionization of non-volatile organic compounds by fast heavy ions and their separation by mass spectrometry☆ Nuclear Instruments and Methods. ,vol. 139, pp. 195- 201 ,(1976) , 10.1016/0029-554X(76)90675-3
Hartmut Jungclas, Harald Danigel, Lothar Schmidt, Jörg Dellbrügge, Combined liquid chromatography time-of-flight mass spectrometry: An application of252Cf fission fragment induced desorption mass spectrometry Organic Mass Spectrometry. ,vol. 17, pp. 499- 502 ,(1982) , 10.1002/OMS.1210171008