System and method for time-to-voltage conversion with lock-out logic

作者: Yanfeng Du , Brian David Yanoff , Naresh Kesavan Rao , Jianjun Guo

DOI:

关键词: Integrating ADCTime delay and integrationIntegratorControl theoryVoltageSignal generatorControl theoryCurrent sourceSignalEngineering

摘要: An event time stamping system comprising a current source, an integrator input and output, configured to output voltage proportional the length of source is coupled input, one or more switches couple upon receipt signal de-couple from control trigger. The further comprises lock-out generator generate signal, controller switches, wherein trigger based on ensure minimum integration time.

参考文章(24)
K. D. Ianakiev, C. E. Moss, PERFORMANCE OF MULTI-ELEMENT CdZnTe DETECTORS Conference title not supplied, Conference location not supplied, Conference dates not supplied. ,(1999)
Tümay O. Tümer, Gerard Visser, Multi-channel integrated circuit ,(2004)
Charles E. Goetzinger, David E. Tetzlaff, System for calibrating analog-to-digital converter ,(1995)
Einar Nygard, Bradley E. Patt, Jan S. Iwanczyk, Pixelated cadmium zinc telluride based photon counting mode detector ,(2004)
Craig S. Levin, James Matteson, Semiconductor crystal high resolution imager ,(2005)
Kensuke Amemiya, Kazuma Yokoi, Shinichi Kojima, Katsutoshi Tsuchiya, Osamu Yokomizo, Hiroshi Kitaguchi, Norihito Yanagita, Yuuichirou Ueno, Semiconductor radiation detector, positron emission tomography apparatus, semiconductor radiation detection apparatus, detector unit and nuclear medicine diagnostic apparatus ,(2005)
Aharon Amrami, Amir Pansky, Yaron Hefetz, Naor Wainer, Pixelated photon detector ,(1998)
Gianluigi De Geronimo, Paul O'Connor, Anand Kandasamy, Joe Grosholz, Advanced-readout ASICs for multielement CdZnTe detectors International Symposium on Optical Science and Technology. ,vol. 4784, pp. 105- 118 ,(2003) , 10.1117/12.455775