Contacting carbon nanotubes selectively with low-ohmic contacts for four-probe electric measurements
作者： A. Bachtold , M. Henny , C. Terrier , C. Strunk , C. Schönenberger
DOI: 10.1063/1.121778
关键词: Contact resistance 、 Optoelectronics 、 Ohmic contact 、 Scanning electron microscope 、 Nanotechnology 、 Materials science 、 Fullerene 、 Electrode 、 Electron beam-induced deposition 、 Carbon nanotube 、 Nanotube
摘要: … the contact resistances can increase to large values in the M range again after one week at room temperature. A second exposure brings the resistances back to small values. This …
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