Mean and Fluctuating Property Measurements with Filtered Angularly Resolved Rayleigh Scattering
作者： Richard E. Huffman , Martin Boguzsko , Gregory S. Elliott
DOI: 10.2514/1.45832
关键词: Raman scattering 、 Materials science 、 Charge-coupled device 、 Atomic physics 、 Vapor pressure 、 Rayleigh scattering 、 Doppler broadening 、 Photodiode 、 Optics
摘要:
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