作者: Y. Feng , W. L. Li , J. P. Wang , J. H. Yin , W. D. Fei
DOI: 10.1039/C5TA04777C
关键词: Dielectric 、 Volume fraction 、 Scanning electron microscope 、 Composite material 、 Fabrication 、 Transmission electron microscopy 、 Raman spectroscopy 、 Materials science 、 Chemical vapor deposition 、 Composite number
摘要: … The dielectric spectroscopy and conductivity were carried out using an impedance analyzer (Agilent 4294A) in the frequency range of 10 2 to 10 6 Hz. The relative humidity (≈50%) of …