作者: S. A. de Vries , P. Goedtkindt , S. L. Bennett , W. J. Huisman , M. J. Zwanenburg
DOI: 10.1103/PHYSREVLETT.80.2229
关键词: Ion 、 Crystallography 、 X-ray crystallography 、 Surface (mathematics) 、 Aqueous solution 、 Synchrotron radiation 、 Crystal 、 Materials science 、 Diffraction 、 Metal impurities
摘要: … KDP, we present an interface atomic structure determination of a crystal in contact with its growth … of metal impurities on the macroscopic growth morphology. [S0031-9007(98)05505-7] …