Benefits of the controlled reactive high-power impulse magnetron sputtering of stoichiometric ZrO2 films

作者: J. Vlček , J. Rezek , J. Houška , T. Kozák , J. Kohout

DOI: 10.1016/J.VACUUM.2014.12.004

关键词: Materials scienceHigh-power impulse magnetron sputteringAnalytical chemistryPower densityPopulationArgonMolar absorptivityCavity magnetronSputter depositionIon

摘要: Abstract High-power impulse magnetron sputtering with a pulsed reactive gas (oxygen) flow control was used for high-rate depositions of densified, highly optically transparent, stoichiometric ZrO2 films onto floating substrates. The were performed using strongly unbalanced directly water-cooled planar Zr target 100 mm diameter in argon–oxygen mixtures at the argon pressure 2 Pa. repetition frequency 500 Hz deposition-averaged power density from 5 Wcm−2 to 53 Wcm−2. voltage pulse durations ranged 50 μs 200 μs. target-to-substrate distance 100 mm. An optimized location oxygen inlets front and their orientation toward substrate made it possible improve quality due minimized arcing sputtered enhance deposition rates up 120 nm/min 52 Wcm−2, duration 200 μs temperature less than 120 °C. exhibited hardness 16 GPa, refractive index 2.19 an extinction coefficient 2 × 10−3 (both wavelength 550 nm). Under these conditions, we measured highest (Zr+ + Zr2+) ( O 2 +  + O+) ion fractions total fluxes positive ions, low population high-energy O− ions position.

参考文章(64)
M. Mayer, SIMNRA user's guide Max-Planck-Institut für Plasmaphysik. ,(1997)
P Kudláček, J Vlček, K Burcalová, J Lukáš, Highly ionized fluxes of sputtered titanium atoms in high-power pulsed magnetron discharges Plasma Sources Science and Technology. ,vol. 17, pp. 025010- ,(2008) , 10.1088/0963-0252/17/2/025010
J Vlček, K Burcalová, A phenomenological equilibrium model applicable to high-power pulsed magnetron sputtering Plasma Sources Science and Technology. ,vol. 19, pp. 065010- ,(2010) , 10.1088/0963-0252/19/6/065010
J. Alami, P. Eklund, J.M. Andersson, M. Lattemann, E. Wallin, J. Bohlmark, P. Persson, U. Helmersson, Phase tailoring of Ta thin films by highly ionized pulsed magnetron sputtering Thin Solid Films. ,vol. 515, pp. 3434- 3438 ,(2007) , 10.1016/J.TSF.2006.10.013
D Benzeggouta, M C Hugon, J Bretagne, Study of a HPPMS discharge in Ar/O2 mixture: II. Plasma optical emission and deposited RuOx film properties Plasma Sources Science and Technology. ,vol. 18, pp. 045026- ,(2009) , 10.1088/0963-0252/18/4/045026
S. Mahieu, W. P. Leroy, K. Van Aeken, D. Depla, Modeling the flux of high energy negative ions during reactive magnetron sputtering Journal of Applied Physics. ,vol. 106, pp. 093302- ,(2009) , 10.1063/1.3247545
S. Venkataraj, Oliver Kappertz, Hansjörg Weis, Robert Drese, R. Jayavel, Matthias Wuttig, Structural and optical properties of thin zirconium oxide films prepared by reactive direct current magnetron sputtering Journal of Applied Physics. ,vol. 92, pp. 3599- 3607 ,(2002) , 10.1063/1.1503858
J. Alami, P. Eklund, J. Emmerlich, O. Wilhelmsson, U. Jansson, H. Högberg, L. Hultman, U. Helmersson, High-power impulse magnetron sputtering of Ti Si C thin films from a Ti3SiC2 compound target Thin Solid Films. ,vol. 515, pp. 1731- 1736 ,(2006) , 10.1016/J.TSF.2006.06.015