作者: Kanichi Kamiya , Toshinobu Yoko , Tetsuya Sano , Katsuhisa Tanaka
DOI: 10.1016/0022-3093(90)90235-E
关键词: Transmission electron microscopy 、 Electrical resistivity and conductivity 、 Raman spectroscopy 、 Sol-gel 、 Raman scattering 、 Composite material 、 Materials science 、 Inorganic compound 、 X-ray crystallography 、 Carbon 、 Mineralogy
摘要: Abstract Carbon/SiO2 glass composites containing fine carbon particles up to 25–30 wt% were prepared from CH3Si(OC2H5)3 by the sol-gel process. The included was characterized X-ray diffraction, Raman spectroscopy and electron microscopy. Very low electrical conductivity of compared with C/SiO2 made in other ways explained be a consequence uniform distribution isolated which do not form an electrically conducting path composites.