A Parametric Degradation Model Used in Reliability, Survival Analysis, and Quality of Life
作者： M. Nikulin , L. Gerville-Réache , S. Orazio
DOI: 10.1007/978-0-8176-4542-7_8
关键词: Mathematics 、 Minimum-variance unbiased estimator 、 Reliability engineering 、 Degradation (telecommunications) 、 Wiener process 、 Statistics 、 Bias of an estimator 、 Estimator 、 Reliability (statistics) 、 Nuisance parameter 、 Parametric statistics
摘要: A parametric degradation model based on the Wiener process is studied. The best unbiased estimators are constructed for parameters of this model.
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