Scanning tunneling microscope
作者： Sang‐il Park , C. F. Quate
DOI: 10.1063/1.1139508
关键词: Voltage 、 Optoelectronics 、 Quantum tunnelling 、 Scanning electron microscope 、 Electron microscope 、 Electronic circuit 、 Scanning tunneling microscope 、 Electronics 、 Materials science 、 Tunnel effect
摘要: This article describes the design of a scanning tunneling microscope (STM) which is suitable for surface science work. Various concepts in mechanical structure and electronic circuitry STM have been pursued to optimize its performance. has designed especially meet requirement situ sample preparation transfer ultrahigh vacuum. The electronics this are capable taking simultaneous images with opposite polarities voltages.
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sci-hub.se 参考文章(14)
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