Unique density profile determination in thin films
作者： J. Penfold , J.R.P. Webster , D.G. Bucknall , D.S. Sivia
DOI: 10.1016/0927-7757(93)02717-S
关键词: Reflectometry 、 Transition metal 、 Nickel 、 Substrate (electronics) 、 Neutron 、 Condensed matter physics 、 Neutron reflectometry 、 Analytical chemistry 、 Polymer 、 Materials science 、 Thin film
摘要: Abstract A recent paper by D.S. Sivia and R. Pynn (SPIE Conf. Proc., Vol. 1738, 1992) has shown theoretically the use of polarised neutrons a magnetised substrate to determine uniquely density profile from neutron reflectometry data. Presented here are preliminary results technique applied polymer film on nickel substrate.
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