Using Convergent-Beam Techniques
作者： David B. Williams , C. Barry Carter
DOI: 10.1007/978-1-4757-2519-3_21
关键词: Statistical physics 、 Measure (mathematics) 、 Space (mathematics) 、 Lattice constant 、 Beam (structure) 、 Point (geometry) 、 Ewald's sphere 、 Group (mathematics) 、 Crystal system 、 Computer science
摘要: In the preceding chapter we described how to obtain a variety of CBED patterns under various experimental conditions, but always with focused beam. this you will find out why these are so useful: they contain wealth quantitative data. First, we’ll show measure specimen thickness. Next, describe steps for complete crystallographic analysis your including determination its unit cell, crystal system, point group, and space group. Then, introduce methods determining extremely small changes in lattice parameter which can be used strain and, indirectly, composition. Other convergent-beam techniques also available, some use somewhat defocused beam, as well different microdiffraction briefly summarize at end chapter.
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