In-situ observation of nickel oxidation using synchrotron based full-field transmission X-ray microscopy
作者： Andrew M. Kiss , William M. Harris , Steve Wang , Joan Vila-Comamala , Alex Deriy
DOI: 10.1063/1.4789991
关键词: Synchrotron 、 X-ray 、 XANES 、 Microscopy 、 Absorption (electromagnetic radiation) 、 Nickel 、 Analytical chemistry 、 Chemical reaction 、 Spectroscopy 、 Chemistry
摘要: An in situ imaging-based approach is reported to study chemical reactions using full-field transmission x-ray microscopy (TXM). Ni particles were oxidized at temperatures between 400 and 850 °C the TXM directly observe their morphology change while composition monitored by absorption near edge spectroscopy. Reaction rates activation energies are calculated from image data. The goal of this effort better understand oxidation electrode materials. developed will be an effective technique for studying behavior nano-scale.
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