X-ray diffraction apparatus and technique for measuring grain orientation using x-ray focusing optic
作者： Huapeng Huang , Alexei Vershinin
DOI:
关键词: Grain orientation 、 Excitation 、 X-ray crystallography 、 Diffraction 、 Beam (structure) 、 X-ray 、 Materials science 、 Sample (graphics) 、 Optics 、 Crystal
摘要: An x-ray diffraction apparatus for measuring crystal orientation of a multiple grain sample. excitation path is provided having focusing optic collecting x-rays from an source and redirecting the collected into beam converging on single At least one point detector sample are rotated relative to each other; obtained based upon patterns first second planes within apparatus.
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