Integrated circuit test result communication
作者： Ernest Allen , Andrew E. Horch , Anthony Stoughton , Christopher Segura , Robert C. Collins
DOI:
关键词: Pin compatibility 、 Computer hardware 、 Chip 、 Circuit extraction 、 Electronic engineering 、 Computer science 、 Non-volatile memory 、 Integrated circuit
摘要: A chip has formed thereon integrated circuit elements, which include a main and an associated non volatile memory structure. test result with prior testing of function the is stored in Additional apparatus methods are disclosed.
lens.org 参考文章(10)
Ernest Allen, Anthony Stoughton, Disabling poorly testing RFID ICs ,(2006)
Prabhansu Chakrabarti, Jyh-Ming Jong, Leo Yuan, Wai Fong, Jue Wu, Brian L. Smith, Automated calibration of I/O over a multi-variable eye window ,(2001)
Jin-Hong Ahn, Hee-bok Kang, Integrated circuit with embedded feram-based rfid ,(2006)
Chad A. Cobbley, John VanNortwick, Tongbi Jiang, Method of depositing a thermoplastic polymer in semiconductor fabrication ,(2001)
Donald C. Stark, Timothy C. Chang, Multiple sweep point testing of circuit devices ,(2002)
Luc Beauvillier, Dah-Weih Duan, Michael John Brady, Paul Andrew Moskowitz, Daniel J. Friedman, Philip Murphy, Method and apparatus for testing RFID tags ,(1998)
Mark E. Tuttle, Testing and burn-in of IC chips using radio frequency transmission ,(1998)
Patrick L. Helton, Kursat Eroglu, Christopher A. Wiklof, Method and apparatus for verifying rfid tags ,(1999)
Paul J. Huelskamp, Robert W. Warren, Testing device and method for an integrated circuit ,(2004)