TRIAD: a triple patterning lithography aware detailed router
作者： Yen-Hung Lin , Bei Yu , David Z. Pan , Yih-Lang Li
关键词: Computer science 、 Graph (abstract data type) 、 Distributed computing 、 Integrated circuit design 、 Security token 、 Graph 、 Triple patterning lithography 、 Greedy coloring 、 Router
摘要: TPL-friendly detailed routers require a systematic approach to detect TPL conflicts. However, the complexity of conflict graph (CG) impedes directly detecting conflicts in CG. This work proposes token graph-embedded (TECG) facilitate detection while maintaining high coloring-flexibility. We then develop aware router (TRIAD) by applying TECG gridless with stitch generation. Compared greedy coloring approach, experimental results indicate that TRIAD generates no and few stitches shorter wirelength at cost 2.41× runtime.
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arxiv.org参考文章(19)
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