Deriving leaf mass per area (LMA) from foliar reflectance across a variety of plant species using continuous wavelet analysis

作者: Tao Cheng , Benoit Rivard , Arturo G. Sánchez-Azofeifa , Jean-Baptiste Féret , Stéphane Jacquemoud

DOI: 10.1016/J.ISPRSJPRS.2013.10.009

关键词: ReflectivityDry matterMathematicsRemote sensingWaveletContinuous wavelet analysisSpecific leaf areaPlant speciesLeaf mass per areaRange (statistics)

摘要: Abstract Leaf mass per area (LMA), the ratio of leaf dry to area, is a trait central importance understanding plant light capture and carbon gain. It can be estimated from reflectance spectroscopy in infrared region, by making use information about absorption features matter. This study reports on application continuous wavelet analysis (CWA) estimation LMA across wide range species. We compiled large database spectra acquired within framework three independent measurement campaigns (ANGERS, LOPEX PANAMA) generated simulated using PROSPECT optical properties model. CWA was applied measured databases extract that correlate with LMA. These were assessed terms predictive capability robustness while transferring models database. The assessment also conducted two existing spectral indices, namely Normalized Dry Matter Index (NDMI) Difference index for (NDLMA). Five common determined databases, which showed significant correlations (R2: 0.51–0.82, p

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