作者: Wendell Starr , Lawrence Hogue
关键词: Capacitor 、 Reliability engineering 、 Stress testing (software) 、 Reliability (semiconductor) 、 Engineering 、 Conditioning 、 Electrical engineering
摘要: The results of a study the life behavior developmental capacitor synthetic film type are presented. is shown to be extremely sensitive thermal history capacitor. Heating at 85°C for 100 days increased by least 40 1. Progressive stress testing in which voltage with time aided materially defining this effect as well showing that two mechanisms failure were present. purpose presentation present an example conditioning because it not generally recognized its on can serious often is.