作者: Ayumu Osumi , Kenta Yamada , Yusuke Asada , Youichi Ito
关键词: Optics 、 Materials science 、 Slit 、 Second-harmonic imaging microscopy 、 Thin metal 、 Guided wave testing 、 Intensity (physics) 、 Visualization 、 Ultrasonic sensor 、 Nonlinear system
摘要: We propose the visualization of defects by means guided waves generated simultaneously at multiple frequencies using nonlinearity a high-intensity ultrasonic wave. This report presents use proposed method to visualize slit in thin metal plate. The results confirm that even though multiple-frequency infiltrate defect area different directions, can be visualized imaging wave propagation.