Microstructure evolution of beryllium during proton irradiation
作者： Suk Hoon Kang , Jinsung Jang , Yong Hwan Jeong , Tae Kyu Kim , Jae Sang Lee
DOI: 10.3938/JKPS.63.1414
关键词: Composite material 、 Materials science 、 Beryllium 、 Fluence 、 Microstructure 、 Irradiation 、 Optics 、 Acceleration voltage 、 Transmission electron microscopy 、 Void (astronomy) 、 Grain boundary
摘要: The effects of proton irradiation on a beryllium reflector in terms microstructure evolution have been studied to emulate the neutron irradiation. Protons were irradiated sample with acceleration voltage 120 keV and fluence 2.0 × 1018 ions/cm2 at room temperature. size damaged layer was estimated through Monte Carlo simulation (SRIM2012 software) transmission electron microscopy (TEM) observation. While observed by using TEM, roughly 1 µm, value coincident result. most severely area occurred 600 nm depth; tens-of-nanometer-sized voids distributed. Multiple entire area, preferentially distributed along grain boundaries, interfaces between matrix BeO particles. Equi-axed voids, 10 diameter, boundary, planar interfaces. also grains; evolutions affected orientation rather than direction. selective diffraction pattern (SADP) from TEM showed that arrays multiple considerably longer basal plane. atoms could be easily dislocated while plane aligned direction perpendicular
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