Investigation of third order nonlinear optical properties of undoped and indium doped zinc oxide (InZnO) thin films by nanosecond Z-scan technique
作者： Zin Maung Htwe , Yun-Dong Zhang , Cheng-Bao Yao , Hui Li , Han-Yang Li
DOI: 10.1016/J.OPTMAT.2015.12.004
关键词: Scanning electron microscope 、 Indium 、 Z-scan technique 、 Thin film 、 Sputter deposition 、 Doping 、 Crystallite 、 Substrate (electronics) 、 Optoelectronics 、 Optics 、 Materials science
摘要: … as 2.13 mm and 2.65 × 10 12 W / m 2 respectively. The … ( esu ) where n 0 is the linear refractive indices of ZnO and InZnO thin films, ε 0 is the permittivity of free space ( 8.85187 × 10 - 12 …
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