Compact atomic force microscope
作者： Dror Sarid , John A. Gurley , Virgil B. Elings
DOI:
关键词: Magnetic force microscope 、 Atomic force microscopy 、 Sample (graphics) 、 Scanning Hall probe microscope 、 Scanner 、 Chemistry 、 Optics 、 Measure (physics) 、 Microscope 、 Magnetic field
摘要: This is an atomic force microscope in which the sensor can be built as a very small integrated structure. The utilizes optical interference and operated either contact mode for high resolution or non-contact to measure electric magnetic fields. One configuration of this stand-alone placed on suspended above large samples scanning local areas thereof. into scanner so that scanned over stationary sample.
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