Shear modulation force microscopy study of near surface glass transition temperatures
作者： S. Ge , Y. Pu , W. Zhang , M. Rafailovich , J. Sokolov
DOI: 10.1103/PHYSREVLETT.85.2340
关键词: Polymer 、 Materials science 、 Microscopy 、 Composite material 、 Shear force 、 Glass transition 、 Atomic force microscopy 、 Shear (geology) 、 Polymer thin films 、 Optics
摘要: We report results of glass transition (T(g)) measurements for polymer thin films using atomic force microscopy (AFM). The AFM mode, shear modulation (SMFM), involves measuring the temperature-dependent on a tip modulated parallel to sample surface. Using this method we have measured surface T(g) (17-500 nm) and found that is independent film thickness (t>17 nm), strength substrate interactions, or even presence substrate.
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