作者: Yoshio Katano , Akimichi Hishinuma , Kensuke Shiraishi
DOI: 10.3327/JNST.14.723
关键词: Electron microscope 、 Swelling 、 Irradiation 、 Dislocation 、 Analytical chemistry 、 High voltage electron microscopy 、 Vacancy defect 、 Void (astronomy) 、 Crystallography 、 Fluence 、 Materials science
摘要: In a high voltage electron microscope, solution treated Type 316 stainless steel was electron-irradiated at temperatures in the range of 370–630°C to dose about 30 dpa. The swelling (ΔV/V) induced by irradiation beyond 5 dpa is well described an empirical equation, ΔV/V=A(dpa) n , under constant void and dislocation densities. With increasing temperature, fluence exponent increases pre-exponent term A decreases. At 550°C irradiation, takes value 1.5 due diffusion-limited growth. larger than higher temperature (>550°C) attributable surface reaction-limited smaller for low (≲500°C) appears arise from assisted vacancy diffusion. peak specimen irradiated 570°C, which shifts with increase dose.