Properties of nickel doped In2S3 thin films deposited by spray pyrolysis technique

作者: M. Kraini , N. Bouguila , N. Moutia , J. El Ghoul , K. Khirouni

DOI: 10.1007/S10854-017-8099-4

关键词: Constant phase elementAnalytical chemistryCrystalliteNickelBand gapThin filmMolar absorptivityMaterials scienceGrain boundaryDoping

摘要: In this work, nickel (Ni) doped indium sulfide (In2S3) films have been prepared by the spray pyrolysis (CSP) technique on glass substrates at 350 °C. The Ni doping level was changed with Ni:In (0, 2 and 4% in solution). structural studies reveal that deposited are polycrystalline nature exhibiting cubic structure. crystallite size decreases from 27.5 to 23 nm root mean square roughness values increase 13 18 nm. transmission coefficient is about 70–55% visible region 85–75% near-infrared region. band gap energy increases content 2.74 2.82 eV for direct transitions. refractive index of In2S3:Ni thin decrease 2.43 2.40 extinction range 0.01–0.20. Besides, AC conductivity contribution interpreted using universal Jonscher’s power law it found thermally activated can be described correlated barrier-hopping models. These help form significant correlation between temperature activation energy. Nyquist plots show electrical response accurately fitted Cole–Cole model represented an equivalent circuit which consists a parallel combination resistance constant phase element. From analysis, evidence grain boundary conduction has observed.

参考文章(48)
S.P. Nehra, S. Chander, Anshu Sharma, M.S. Dhaka, Effect of thermal annealing on physical properties of vacuum evaporated In2S3 buffer layer for eco-friendly photovoltaic applications Materials Science in Semiconductor Processing. ,vol. 40, pp. 26- 34 ,(2015) , 10.1016/J.MSSP.2015.06.049
A. K. Jonscher, The ‘universal’ dielectric response Nature. ,vol. 267, pp. 673- 679 ,(1977) , 10.1038/267673A0
M. Younas, M. Nadeem, M. Atif, R. Grossinger, Metal-semiconductor transition in NiFe2O4 nanoparticles due to reverse cationic distribution by impedance spectroscopy Journal of Applied Physics. ,vol. 109, pp. 093704- ,(2011) , 10.1063/1.3582142
Bernard Dennis Cullity, Elements of X-ray diffraction ,(1956)
Yunhui He, Danzhen Li, Guangcan Xiao, Wei Chen, Yibin Chen, Meng Sun, Hanjie Huang, Xianzhi Fu, A New Application of Nanocrystal In2S3 in Efficient Degradation of Organic Pollutants under Visible Light Irradiation Journal of Physical Chemistry C. ,vol. 113, pp. 5254- 5262 ,(2009) , 10.1021/JP809028Y
Anis Akkari, Cathy Guasch, Michel Castagne, Najoua Kamoun-Turki, Optical study of zinc blend SnS and cubic In2S3:Al thin films prepared by chemical bath deposition Journal of Materials Science. ,vol. 46, pp. 6285- 6292 ,(2011) , 10.1007/S10853-011-5626-1
A. Khorsand Zak, W.H. Abd. Majid, M.E. Abrishami, Ramin Yousefi, X-ray analysis of ZnO nanoparticles by Williamson–Hall and size–strain plot methods Solid State Sciences. ,vol. 13, pp. 251- 256 ,(2011) , 10.1016/J.SOLIDSTATESCIENCES.2010.11.024
N. Barreau, Indium sulfide and relatives in the world of photovoltaics Solar Energy. ,vol. 83, pp. 363- 371 ,(2009) , 10.1016/J.SOLENER.2008.08.008
A. Timoumi, H. Bouzouita, B. Rezig, Optical constants of Na–In2S3 thin films prepared by vacuum thermal evaporation technique Thin Solid Films. ,vol. 519, pp. 7615- 7619 ,(2011) , 10.1016/J.TSF.2011.01.410