作者: T Irisawa , T K Yamada , T Mizoguchi
DOI: 10.1088/1367-2630/11/11/113031
关键词: Field ion microscope 、 Molecular physics 、 Magnetization 、 Perpendicular 、 Work function 、 Electron 、 Physics 、 Scanning tunneling microscope 、 Spin polarization 、 Field emission microscopy 、 Optics
摘要: The atomic and electronic structures at the apex of W tips were studied by means field ion microscopy emission microscopy, before after thermal deposition a 5 nm Fe film. Two geometries tip, conventional hemi-spherical type chisel (flat needle) type, prepared. hemispherical had 110 direction parallel perpendicular to tip axis, respectively. coated films found be most likely in non-crystalline phase, have lower work function leading drastic change electron from apexes. spin-polarization vectors field-emitted electrons these Fe/W investigated with Mott detector rotatable mechanism tips. A similar absolute value vector was obtained for each Fe/W, while dependent on shape apex. angle axis θ=45° θ=66° spin-polarized scanning tunneling setup rotation such made it possible detect both in-plane out-of-plane spin component sample magnetization.