Spin polarization vectors of field emitted electrons from Fe/W tips

作者: T Irisawa , T K Yamada , T Mizoguchi

DOI: 10.1088/1367-2630/11/11/113031

关键词: Field ion microscopeMolecular physicsMagnetizationPerpendicularWork functionElectronPhysicsScanning tunneling microscopeSpin polarizationField emission microscopyOptics

摘要: The atomic and electronic structures at the apex of W tips were studied by means field ion microscopy emission microscopy, before after thermal deposition a 5 nm Fe film. Two geometries tip, conventional hemi-spherical type chisel (flat needle) type, prepared. hemispherical had 110 direction parallel perpendicular to tip axis, respectively. coated films found be most likely in non-crystalline phase, have lower work function leading drastic change electron from apexes. spin-polarization vectors field-emitted electrons these Fe/W investigated with Mott detector rotatable mechanism tips. A similar absolute value vector was obtained for each Fe/W, while dependent on shape apex. angle axis θ=45° θ=66° spin-polarized scanning tunneling setup rotation such made it possible detect both in-plane out-of-plane spin component sample magnetization.

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