The X‐Ray Shadow Microscope
作者： V. E. Cosslett , W. C. Nixon
DOI: 10.1063/1.1721338
关键词: Microscope 、 Magnification 、 Point source 、 Shadow 、 Projection (mathematics) 、 Resolution (electron density) 、 Acceleration voltage 、 Optics 、 Physics 、 Microscopy 、 General Physics and Astronomy
摘要: Shadow projection permits higher resolution and simpler operation than other methods of x‐ray microscopy. A point source, less 1μ in diameter, is obtained by the use magnetic electron lenses used for projecting shadow images at a primary magnification up to 100× with an exposure time order minutes. The metal foil as target tube window insures high intensity specimen, which air. resolving power little short best optical performance has been accelerating voltage 10 kv. practical limitations resolution, contrast, are discussed detail. 100A should be practicable, but only longer x‐rays 1 hour.
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