Capacitively-coupled test probe
作者： Ed O. Schlotzhauer , John M. Heumann , David T. Crook , John E. McDermid , Ronald J. Peiffer
DOI:
关键词: Electrical engineering 、 Mechanical probe station 、 Bandwidth (signal processing) 、 Amplifier 、 Shielded cable 、 Physics 、 Optoelectronics 、 Attenuation 、 Test probe 、 Capacitance 、 RF probe
摘要: The invention is a capacitively coupled probe which can be used for non-contact acquisition of both analog and digital signals. includes shielded tip, body mechanically to the an amplifier circuit disposed within body. receives sensed signal from tip produces amplified in response thereto. has large bandwidth accommodate high-frequency Further, very low input capacitance high resistance reduce attenuation loading being probed. closely adjacent order stray distributed capacitances. A reconstruction reconstructs signals signal.
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