Using the symmetrical six-port waveguide junction as a six-port reflectometer

作者: S.P. Yeo , W.L. Wong

DOI: 10.1109/IMTC.1991.161583

关键词: MicrowaveElectronic circuitAccuracy and precisionReflection (physics)Six portOpticsWaveguide (acoustics)Time-domain reflectometerMaterials scienceOptical time-domain reflectometer

摘要: The objective of the project described is to determine feasibility using a symmetrical six-port junction as reflectometer (in waveguide form) for measuring complex reflection coefficients at microwave frequencies. results obtained from series laboratory trials indicate that simple modification basic circuit may help improve measurement accuracy proposed reflectometer. >

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