作者: M.E. Sánchez-Vergara , S.A. González-Aranzábal , M.A. Sauceda-Arriaga , A. Ortiz , J.R. Alvarez
DOI: 10.1016/J.JNONCRYSOL.2009.11.017
关键词: Amorphous solid 、 Vacuum deposition 、 Crystalline silicon 、 Scanning electron microscope 、 Band gap 、 Ellipsometry 、 Chemistry 、 Infrared 、 Analytical chemistry 、 Thin film
摘要: Abstract Molecular-material thin films of (PPh 4 ) 2 [Fe(CN) 5 NO] and a double potassium salt from 1,8-dihydroxyanthraquinone have been prepared by vacuum thermal evaporation on Corning glass substrates crystalline silicon wafers. The surface morphology, thickness structure the deposited were studied scanning electron microscopy (SEM), atomic force (AFM), ellipsometric measurements, ultraviolet–visible (UV–vis) Fourier-transform infrared (FT-IR) spectroscopies. amorphous show same intra-molecular bonds as IR spectroscopic studies, which suggests that process did not alter initial chemical structures. conductivity electrical-conduction mechanism in also investigated. Finally, optical band gap ( E g these molecular complexes was evaluated absorption measurements.