作者: Charles R Farrar , Keith Worden
关键词: Technology development 、 Equipment failure 、 Condition monitoring 、 Computer science 、 Risk analysis (engineering) 、 Statistical pattern 、 Structural health monitoring 、 Process (engineering)
摘要: This introduction begins with a brief history of SHM technology development. Recent research has begun to recognise that productive approach the Structural Health Monitoring (SHM) problem is regard it as one statistical pattern recognition (SPR); paradigm addressing in such way described detail herein forms basis for organisation this book. In process providing historical overview and summarising SPR paradigm, subsequent chapters book are cited an effort show how they fit into SHM. conclusions stated number technical challenges authors believe must be addressed if gain wider acceptance.