Hierarchical diagnostic testing arrangement for a data processing system having operationally interdependent circuit boards
作者： Lawrence J. Haas , Kathleen K. Glass
DOI:
关键词: Data processing system 、 Subroutine 、 Computer hardware 、 Test data 、 Engineering 、 Diagnostic test 、 Printed circuit board
摘要: A diagnostic test facility for a processor having plurality of boards hierarchically arranged with respect to function. The first and most independent board contains the microstore that stores usual information plus subroutines required all boards. is tested by executing associated collecting comparing data predicted as are executed. second using facilities on board. In similar manner remaining in sequence testing each circuitry priorly
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