作者: Ian M. Baker
DOI: 10.1007/978-3-319-48933-9_34
关键词: Photodiode 、 Infrared 、 Optoelectronics 、 Semiconductor 、 Infrared detector 、 Band gap 、 Electron avalanche 、 Materials science 、 Operating temperature 、 Detector
摘要: … 34.12 is the simplest device structure currently used. It is consistent with a number of junction-forming processes, e. g., ion implantation, diffusion, and ion milling. …