II-VI Narrow Bandgap Semiconductors: Optoelectronics

作者: Ian M. Baker

DOI: 10.1007/978-3-319-48933-9_34

关键词: PhotodiodeInfraredOptoelectronicsSemiconductorInfrared detectorBand gapElectron avalancheMaterials scienceOperating temperatureDetector

摘要: … 34.12 is the simplest device structure currently used. It is consistent with a number of junction-forming processes, e. g., ion implantation, diffusion, and ion milling. …

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