作者: G. Lérondel , A. Sinno , L. Chassagne , S. Blaize , P. Ruaux
DOI: 10.1063/1.3200953
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摘要: Millimeter scale near-field optical microscopy is here reported. It demonstrated in the near infrared by observing light propagating an integrated glass waveguide. Enlarged imaging was made possible thanks to use of a homemade interferometric translation stage with nanometric repeatabilities combined commercial atomic force microscope. An component used as representative example multiscale components requiring large highly resolved mapping. By stationary waves on millimeter long range followed Fourier analysis, uncertainty few 10−4 waveguide modes effective index obtained. While improving optogeometrical parameter retrieval precision, scans make technique sensitive properties such birefringence.