作者: Yunyan Liu , Tong Zhou , Meiling Sun , Dong Zhao , Qinqin Wei
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摘要: The growth dynamics of CH3NH3PbI3 (MAPbI3) perovskite thin films, deposited by thermal evaporation, has been investigated atomic force microscope and height–height correlation function analysis. unstable scaling behavior initial films exhibiting the islands, resulting in rougher film formation observed. After continuous film, roughening characterized analyzing exponent α ~ 0.70, β = 0.79 ± 0.057, 1/z 0.78 0.038, 2D fast Fourier transform. Anomalous MAPbI3 rapid surface are discovered. It is demonstrated that step-edge barrier induced mound may play dominate role mechanism on Si substrates. Further, ITO substrates as a comparison, it reveals largely affected underneath growing films.