作者: Demet Yılmaz , Ali Baltakesmez , Zeynep Uzunoğlu , Mehmet Biber
DOI: 10.1016/J.RADPHYSCHEM.2020.109091
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摘要: Abstract In this work, albedo number, energy and dose of the perovskite films were determined by gamma ray spectrometry. The MAPbBr3-xClx, MAPbBr3-xIx, MAPbl3-xClx MAPbl3 thin coated on Pedot:PSS/ITO substrates static spin coating technique. structural properties with field emission scanning electron microscopy (FE-SEM) images X-ray diffraction (XRD) patterns. Albedo parameters carried out using a high purity germanium detector resolution 182 eV at 5.9 keV 59.54 keV gamma-rays emitted from radioactive source Am241 (59.54 keV). XRF experiments, scattering angle was set 168°. XRD patterns show that structure has forming tetragonal crystallinity. Also, layer compact coverage capability uniform surface feature in terms FE-SEM morphology. It is observed are dependent density, mean atomic number average band gap films. radiation appears to be enhanced significantly MABr treatment.