Reliability considerations in pulsed power resonant conversion.
作者： F. Carastro , A. Castellazzi , J.C. Clare , M. Johnson , M. Bland
DOI: 10.1016/J.MICROREL.2009.06.039
关键词:
摘要: Abstract This work is about the analysis of reliability issues in pulsed power resonant converters, which feature fairly unique operational characteristics, differentiating them substantially from more common electronics applications (e.g., inverters, dc–dc converters). First, an overview converter functioning provided; then, a priori minimisation electro-thermal stress levels affecting active switches (IGBTs) searched for: this based on experimental parametric study turn-off snubber and DC-link capacitance value for overall switching losses can be minimised. Accurate measurements IGBT modules are performed by means calorimetric technique. Finally, infra-red IGBTs surface temperature during transient operation presented, showing that introduction soft-switching strongly reduces amplitude lower frequency thermal cycles.
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