Current enhancement in crystalline silicon photovoltaic by low-cost nickel silicide back contact
作者： R. R. Bahabry , A. Gumus , A. T. Kutbee , N. Wehbe , S. M. Ahmed
DOI: 10.1109/PVSC.2016.7749668
关键词:
摘要: We report short circuit current (Jsc) enhancement in crystalline silicon (C-Si) photovoltaic (PV) using low-cost Ohmic contact engineering by integration of Nickel mono-silicide (NiSi) for …
sci-hub.se 参考文章(8)
Elmar Lohmüller, Sabrina Werner, Rene Hoenig, Johannes Greulich, Florian Clement, Impact of boron doping profiles on the specific contact resistance of screen printed Ag–Al contacts on silicon Solar Energy Materials and Solar Cells. ,vol. 142, pp. 2- 11 ,(2015) , 10.1016/J.SOLMAT.2015.04.039
Xing Sheng, Christopher A Bower, Salvatore Bonafede, John W Wilson, Brent Fisher, Matthew Meitl, Homan Yuen, Shuodao Wang, Ling Shen, Anthony R Banks, Christopher J Corcoran, Ralph G Nuzzo, Scott Burroughs, John A Rogers, None, Printing-based assembly of quadruple-junction four-terminal microscale solar cells and their use in high-efficiency modules Nature Materials. ,vol. 13, pp. 593- 598 ,(2014) , 10.1038/NMAT3946
Julius Janušonis, Algirdas Galdikas, Valdemaras Juzumas, Lina Jaraminė, Tomas Lukštaraupis, Darius Andrijauskas, Vida Janušonienė, Darius Janušonis, Juras Ulbikas, Electroless copper contacts for low concentration silicon solar cells 8TH INTERNATIONAL CONFERENCE ON CONCENTRATING PHOTOVOLTAIC SYSTEMS: CPV-8. ,vol. 1477, pp. 53- 56 ,(2012) , 10.1063/1.4753832
M. Kamp, J. Bartsch, S. Nold, M. Retzlaff, M. Hörteis, S.W. Glunz, Economic Evaluation of Two-Step Metallization Processes for Silicon Solar Cells Energy Procedia. ,vol. 8, pp. 558- 564 ,(2011) , 10.1016/J.EGYPRO.2011.06.182
Muhammad Hussain, Hossain Fahad, Ramy Qaisi, Contact engineering for nano-scale CMOS Physica Status Solidi (a). ,vol. 209, pp. 1954- 1959 ,(2012) , 10.1002/PSSA.201200343
Takashi Yamauchi, Atsuhiro Kinoshita, Yoshinori Tsuchiya, Junji Koga, Koichi Kato, 1 nm NiSi/Si Junction Design based on First-Principles Calculation for Ultimately Low Contact Resistance international electron devices meeting. pp. 1- 4 ,(2006) , 10.1109/IEDM.2006.346791
François Léonard, A. Alec Talin, Electrical contacts to one- and two-dimensional nanomaterials Nature Nanotechnology. ,vol. 6, pp. 773- 783 ,(2011) , 10.1038/NNANO.2011.196
N. Stavitski, M.J.H. van Dal, A. Lauwers, C. Vrancken, A.Y. Kovalgin, R.A.M. Wolters, Systematic TLM Measurements of NiSi and PtSi Specific Contact Resistance to n- and p-Type Si in a Broad Doping Range IEEE Electron Device Letters. ,vol. 29, pp. 378- 381 ,(2008) , 10.1109/LED.2008.917934