High carrier mobility of CoPc wires based field-effect transistors using bi-layer gate dielectric

作者: Murali Gedda , Nimmakayala VV Subbarao , Sk Md Obaidulla , Dipak K Goswami , None

DOI: 10.1063/1.4834355

关键词:

摘要: Polyvinyl alcohol (PVA) and anodized Al2O3 layers were used as bi-layer gate for the fabrication of cobalt phthalocyanine (CoPc) wire base field-effect transistors (OFETs). CoPc wires grown on SiO2 surfaces by organic vapor phase deposition method. These devices exhibit a carrier mobility (μEF) value 1.11 cm2/Vs. The high molecules is attributed to better capacitive coupling between channel through organic-inorganic dielectric layer. Our measurements also demonstrated way determine thicknesses process condition OFETs.

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