Breakdown of the Iron Passive Layer by Use of the Scanning Electrochemical Microscope

作者: John W. Still , David O. Wipf

DOI: 10.1149/1.1837879

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摘要: The scanning electrochemical microscope (SECM) is sued to generate localized corrosion at passivating iron surfaces by using the tip Cl{sup {minus}} ions. Use of SECM allows rapid establishment a locally aggressive chemical environment preselected site on surface. susceptibility for passive layer breakdown and initiation was examined as function time between start growth formation found depend strongly passivation potential In addition generating ions, simultaneously used detect large ion concentration fluctuations began. Current were observed ascribed precursors breakdown.

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