An Electro-Optical X-Ray Diffraction System for Grain Boundary Migration Measurements at Temperature

摘要: Considerable work has been undertaken in order to gain an understanding of the mechanisms responsible for generation recrystallization textures developed upon annealing cold-worked metals. Most direct measurements have consisted measuring increase average diameter largest grain growing into a polycrystalline aggregate. Experimental individual boundaries migrating deformed single crystals, though more fundamental nature, made by far fewer investigators. This is probably due increased experimental difficulties associated with careful control such experiments. previous investigators boundary migration heat-cool-etch method, despite fact that it several marked disadvantages. Other constructed X-ray goniometer furnace and used measure rates while test specimen was maintained at temperature. Since there no published reports use system past thirteen years, must be concluded technique unsuccessful general.