作者: A K Sarin Kumar , M Kawasaki , H Koinuma
DOI: 10.1088/0953-2048/14/12/336
关键词:
摘要: One of the problems with c-axis in-plane aligned YBa2Cu3O7-? films on different substrates is cracking perpendicular to c-axis, which should be avoided if such are used for device applications. The devices based Josephson plasma phenomenon, a phase collective oscillation Cooper pair through insulating barriers intrinsic junctions, requires carrier controlled (Tc = 60?K), and crack-free films. Here we propose that overdoping by substituting Ca at Y site can help produce crack free, This would anneal lower oxygen partial pressure than pristine thus obtain 60?K an elongated c-axis. because substantial incorporation into during annealing followed compression main causes formation. We designed experiment get in substrate plane verified our design fabricating (110) oriented Y0.7Ca0.3Ba2Cu3O7-y SrTiO3 substrates.