Microcircuit learning nets: Hamming-distance behaviour

作者: I. Aleksander

DOI: 10.1049/EL:19700092

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摘要: A probabilistic method based on the Hamming distance is presented for calculating pattern-recognition response of a class single-layer microcircuit learning nets. The prediction behaviour 12-element machine shown to agree with measured responses. also used explain characteristics nets trained translated versions

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