作者: Lars Sennerby , Amir Dasmah , Birgitta Larsson , Mattias Iverhed
DOI: 10.1111/J.1708-8208.2005.TB00070.X
关键词:
摘要: … Back-scatter scanning electron microscopic (BS-SEM) analyses were used to evaluate the … BS-SEM showed intact surface layers of the surface-modified implants after RTQ testing and …