作者: H.Y. Li , C.Y. Yang
DOI: 10.1016/S0017-9310(96)00233-5
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摘要: Abstract An inverse radiation analysis for simultaneous estimation of the single scattering albedo, optical thickness and phase function, from knowledge exit intensities is presented. A genetic algorithm adopted as optimizer to search parameters system. The study shows that albedo can be estimated accurately even with noisy data. function more difficult than thickness.