A Method for the Measurement of Short Minority Carrier Diffusion Lengths in Semiconductors
作者： Alvin M. Goodman
DOI: 10.1063/1.1728351
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摘要: … The most commonly used method for determining the minority carrier diffusion length L in a … minority carrier lifetime r and the relationship L= (Dr)!, where D is the minority carrier diffusion …
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sci-hub.se 参考文章(11)
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