Comparing the resolution of magnetic force microscopes using the CAMST reference samples
作者： Leon Abelmann , Steffen Porthun , Marc Haast , Cock Lodder , Andreas Moser
DOI: 10.1016/S0304-8853(98)00281-9
关键词:
摘要: A set of reference samples for comparing the results obtained with different magnetic force microscopes (MFM) has been prepared. These consist CoNi/Pt magneto-optic multilayers di¤erent thicknesses. The properties multilayer are tailored in such a way that very Þne stripe domain structure occurs remanence. On top this intrinsic structure, bits were written thermomagnetically using laser powers. have imaged six laboratories employing both home-built and commercial microscopes. resolution these microscopes, tips measurement methods varies between 30 100 nm.
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