Detecting and Measuring Defects in Wafer Die Using GAN and YOLOv3
作者： Ssu-Han Chen , Chih-Hsiang Kang , Der-Baau Perng
DOI: 10.3390/APP10238725
关键词:
摘要: … This research used YOLOv3 [19] as the basis for die defect detection and measurement. The basic idea of YOLOv3 is shown in A.2 of Appendix A. The YOLOv3 model is a one-stage …
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