Method and apparatus for polishing wafer

作者: Kimiaki Shimokawa

DOI:

关键词:

摘要: A polishing pad is conditioned using a conditioning disc whose temperature controlled upon Chemical Mechanical Polish. The of the remains unchanged and uniform CMP can be carried out.

参考文章(5)
Seiichi Morimoto, Spencer E. Preston, Wayne A. Mattingly, Method for conditioning the surface of a polishing pad ,(1990)
James E. Sanford, Paul D. Jackson, Parag S. Modi, Stephen C. Schultz, John G. Baca, Glen Ong, Richard B. Rice, Conditioner for a polishing pad and method therefor ,(1993)
Tetsuji Togawa, Kunihiko Sakurai, Seiji Katsuoka, Dressing apparatus and method ,(1995)