Influence of stiffness of carbon-nanotube probes in atomic force microscopy
作者： Seiji Akita , Hidehiro Nishijima , Yoshikazu Nakayama
DOI: 10.1088/0022-3727/33/21/301
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摘要: We report the influence of stiffness carbon nanotubes for probes a scanning probe microscope on images. Multiwalled carbon-nanotube are fabricated by manipulation under direct view electron microscope. Using this manipulation, it is also revealed that Hamaker constant 60×10-20 J van der Waals attraction sidewall nanotube and metallic surface at vacuum ~10-3 Pa. The force curve measurements steep slope in air reveal acting not only tip but wall tip. origin effect discussed terms adhesive energy estimated from curve. This phenomenon suppressed using consisting bundled base to improve samples high roughness.
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